Scanning tunneling microscopy of etched HgTe/CdTe superlattices
نویسندگان
چکیده
منابع مشابه
Cross-sectional scanning tunneling microscopy of InAsSb/InAsP superlattices
Cross-sectional scanning tunneling microscopy ~STM! has been used to characterize compositional structures in InAs0.87Sb0.13 /InAs0.73P0.27 and InAs0.83Sb0.17 /InAs0.60P0.40 strained-layer superlattice structures grown by metal-organic chemical vapor deposition. High-resolution STM images of the ~110! cross section reveal compositional features within both the InAsxSb12x and InAsyP12y alloy lay...
متن کاملScanning Tunneling Microscopy
The invention of the scanning tunneling microscope was a singularity event in the field of surface science and condensed matter physics. The ability to visualize individual atoms in an atomic structure was a huge step forward in experimental development, one for which the inventors were awarded the Nobel Prize in Physics in 1986. While a groundbreaking development, the Scanning Tunneling Micros...
متن کاملScanning tunneling microscopy
This paper begins with a brief introduction the development of scanning tunneling microscopy (STM); in the second part, we will present some basic theory about STM, we will pay more attention on the theory for tunneling between the surfaces of the sample with the model probe tip. Next, we introduce the STM facility, include different modes of operation and other influence factors. In addition, ...
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 1995
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.113141